Abstract: Amorphous InGaZnO (a-IGZO) thin-film transistors (TFTs) severely degrade under AC gate bias stress and AC drain bias stress, whose transfer curves respectively undergo positive shifts of 6.3 ...

Next, the bottom cover is secured before a physical check, where these mini PCs are shaken, bounced on tables, and so on. After passing the ‘physical,’ Beelink puts the machines through a burn-in and ...